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Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The p

Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a de

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting resea

Examines the advances made in the field in recent years and looks at the various methods now used; ideal for graduate students and researchers.

This book introduces and details the key facets of Combined Analysis—an x-ray and/or neutron scattering methodology which combines structural, textural, stres