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Language: en
Pages: 413
Pages: 413
Type: BOOK - Published: 2010-11-25 - Publisher: Cambridge University Press
Thin films are widely used in the electronic device industry. As the trend for miniaturization of electronic devices moves into the nanoscale domain, the reliab
Language: en
Pages: 412
Pages: 412
Type: BOOK - Published: 2010-11-25 - Publisher: Cambridge University Press
Thin films are widely used in the electronic device industry. As the trend for miniaturization of electronic devices moves into the nanoscale domain, the reliab
Language: en
Pages: 744
Pages: 744
Type: BOOK - Published: 1992 - Publisher: Academic Press
Prepared as a textbook complete with problems after each chapter, specifically intended for classroom use in universities.
Language: en
Pages: 274
Pages: 274
Type: BOOK - Published: 2014-12-24 - Publisher: Elsevier
This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, fail
Language: en
Pages: 759
Pages: 759
Type: BOOK - Published: 2014-10-14 - Publisher: Academic Press
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of mo