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Language: en
Pages: 329
Pages: 329
Type: BOOK - Published: 2011-04-14 - Publisher: Springer Science & Business Media
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. T
Language: en
Pages: 708
Pages: 708
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysi
Language: en
Pages: 679
Pages: 679
Type: BOOK - Published: 2013-11-11 - Publisher: Springer Science & Business Media
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in
Language: en
Pages: 554
Pages: 554
Type: BOOK - Published: 2017-11-17 - Publisher: Springer
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electro
Language: en
Pages: 689
Pages: 689
Type: BOOK - Published: 2007-04-30 - Publisher: Springer
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysi