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Testing integrated circuits to verify their operating frequency, known as delay testing, is essential to achieve acceptable product quality. The high cost of fu

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly

On-chip memory arrays are widely used in systems-on-chip. Prior research has shown that timing critical paths often go through these memories. Embedded memories

Path selection and generating tests for small delay faults is an important issue in the delay fault area. A novel technique for generating effective vectors for

Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the