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A Designer’s Guide to Built-In Self-Test
Language: en
Pages: 338
Authors: Charles E. Stroud
Categories: Technology & Engineering
Type: BOOK - Published: 2005-12-27 - Publisher: Springer Science & Business Media

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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's
The Board Designer's Guide to Testable Logic Circuits
Language: en
Pages: 216
Authors: Colin M. Maunder
Categories: Computers
Type: BOOK - Published: 1992 - Publisher: Addison Wesley Publishing Company

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Intel486 SL Microprocessor Superset System Design Guide
Language: en
Pages: 352
Authors: Intel Corporation
Categories: Computers
Type: BOOK - Published: 1992 - Publisher: Intel Corporation (CA)

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Built In Test for VLSI
Language: en
Pages: 376
Authors: Paul H. Bardell
Categories: Technology & Engineering
Type: BOOK - Published: 1987-10-20 - Publisher: Wiley-Interscience

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This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Unt
Proceedings
Language: en
Pages: 1062
Authors:
Categories: Computer storage devices
Type: BOOK - Published: 1994 - Publisher:

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