Search Results

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering cir

An efficient automatic test pattern generator for I$sb{DDQ}$ current testing of CMOS digital circuits is presented. The complete two-line bridging fault set is

The objective of this work was to determine baseline electrical parameters that could be used to evaluate a fabrication process. Two lots of wafers containing N

In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this techno