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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of

This book provides complete step-by-step guidance on the physical implementation of modern integrated circuits, showing you their limitations and guiding you th

This book covers the fundamental knowledge of layout design from the ground up, addressing both physical design, as generally applied to digital circuits, and a

Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics an

This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems