Measurement of Subpicosecond Electron Pulse Length
Author | : |
Publisher | : |
Total Pages | : 6 |
Release | : 1996 |
ISBN-10 | : OCLC:68379609 |
ISBN-13 | : |
Rating | : 4/5 (09 Downloads) |
Book excerpt: A new frequency-resolved bunch-length measuring system has been developed at the Stanford SUNSHINE facility to characterize subpicosecond electron pulses. Using a far-infrared Michelson interferometer, this method measures the spectrum of coherent transition radiation emitted from electron bunches through optical autocorrelation. The electron bunch length is obtained from the measurement with a simple and systematic analysis which includes interference effects caused by the beam splitter. This method demonstrates subpicosecond resolving power that cannot be achieved by existing time-resolved methods. The principle of this method and experimental results are discussed.