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Proceedings of the Symposia on Reliability of Semiconductor Devices/interconnections and Dielectric Breakdown, and Laser Process for Microelectronic Applications
Language: en
Pages: 346
Authors: Electrochemical Society. Dielectric Science and Technology Division
Categories: Technology & Engineering
Type: BOOK - Published: 1992 - Publisher: The Electrochemical Society

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Papers in this volume are from the 180th ECS Meeting, held in held in Phoenix, Arizona, Fall 1991. This symposium addresses all aspects of reliability of semico
Proceedings of the Symposium on Reliability of Metals in Electronics
Language: en
Pages: 258
Authors: Hazara S. Rathore
Categories: Technology & Engineering
Type: BOOK - Published: 1995 - Publisher: The Electrochemical Society

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Proceedings of the Symposia on Reliability of Semiconductor Devices and Interconnection and Multilevel Metallization, Interconnection, and Contact Technologies
Language: en
Pages: 516
Ultraviolet Laser Technology and Applications
Language: en
Pages: 367
Authors: David L. Elliott
Categories: Science
Type: BOOK - Published: 2014-06-28 - Publisher: Academic Press

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Ultraviolet Laser Technology and Applications is a hands-on reference text that identifies the main areas of UV laser technology; describes how each is applied;
国立国会図書館所蔵科学技術関係欧文会議錄目錄
Language: en
Pages: 1762
Authors: 国立国会図書館 (Japan)
Categories: Science
Type: BOOK - Published: 1900 - Publisher:

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