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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive
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Type: BOOK - Published: 2010-12-17 - Publisher: Springer Science & Business Media
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive
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Type: BOOK - Published: 2015-02-24 - Publisher: Springer
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operat
Language: en
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Type: BOOK - Published: 2007-12-20 - Publisher: Springer Science & Business Media
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to sum