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Plasma Charging Damage

Download or Read eBook Plasma Charging Damage PDF written by Kin P. Cheung and published by Springer Science & Business Media. This book was released on 2000-10-04 with total page 362 pages. Available in PDF, EPUB and Kindle.
Plasma Charging Damage
Author :
Publisher : Springer Science & Business Media
Total Pages : 362
Release :
ISBN-10 : 1852331445
ISBN-13 : 9781852331443
Rating : 4/5 (45 Downloads)

Book Synopsis Plasma Charging Damage by : Kin P. Cheung

Book excerpt: In the 50 years since the invention of transistor, silicon integrated circuit (IC) technology has made astonishing advances. A key factor that makes these advances possible is the ability to have precise control on material properties and physical dimensions. The introduction of plasma processing in pattern transfer and in thin film deposition is a critical enabling advance among other things. In state of the art silicon Ie manufacturing process, plasma is used in more than 20 different critical steps. Plasma is sometimes called the fourth state of matter (other than gas, liquid and solid). It is a mixture of ions (positive and negative), electrons and neutrals in a quasi-neutral gaseous steady state very far from equilibrium, sustained by an energy source that balances the loss of charged particles. It is a very harsh environment for the delicate ICs. Highly energetic particles such as ions, electrons and photons bombard the surface of the wafer continuously. These bombardments can cause all kinds of damage to the silicon devices that make up the integrated circuits.


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