Book excerpt: An efficient automatic test pattern generator for I$sb{DDQ}$ current testing of CMOS digital circuits is presented. The complete two-line bridging fault set is considered. Because of the time constraints of I$sb{DDQ}$ testing, an adaptive genetic algorithm (GA) is used to generate compact test sets. To accurately evaluate the test sets, fault grading is performed using a switch-level fault simulator and a mixed-mode electrical-level fault simulator. The test sets are compared with those generated by HITEC, a traditional gate-level test generator. Experimental results for ISCAS85 and ISCAS89 benchmark circuits are presented. The results show that for I$sb{DDQ}$ testing, the GA test sets outperform the HITEC test sets. When the test sets are truncated due to test time constraints, the fault coverages can differ by 10% or more. In addition to test generation and test evaluation, diagnosis (fault location) is also performed using both test sets. Diagnosis is performed using fault dictionaries constructed during test evaluation. In addition to the traditional full dictionary, two reduced dictionaries are also presented. The results show that the reduced dictionaries offer good size-resolution trade-offs when compared with the full dictionary.