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This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-st

Welcome to the proceedings of PATMOS 2008, the 18th in a series of int- national workshops. PATMOS 2008 was organized by INESC-ID / IST - TU Lisbon, Portugal, w

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and effici

The book provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniq

This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft fli