VLSI Test Principles and Architectures
Download or Read eBook VLSI Test Principles and Architectures PDF written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle.
Author | : Laung-Terng Wang |
Publisher | : Elsevier |
Total Pages | : 809 |
Release | : 2006-08-14 |
ISBN-10 | : 9780080474793 |
ISBN-13 | : 0080474799 |
Rating | : 4/5 (93 Downloads) |
Book Synopsis VLSI Test Principles and Architectures by : Laung-Terng Wang
Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.